This is a highly advanced, state-of-the-art instrument. The Tecnai F-20 provides an unique combination of outstanding performance, ease-of-use and high-resolution in micro-analysis and (S)TEM imaging.
The comprehensive capabilities of this instrument make it a powerful tool for studying the structural and chemical properties of materials at an atomic scale. It has Schottky type field emission source giving ultra-high brightness and normally operates at 200 kV. The point resolution is 0.24 nm and line resolution 0.18 nm.
The equipped EDAX EDS system enables elemental analysis in the nanometer order. The GIF, on the other hand, adds energy-loss spectroscopy and filtered imaging capabilities to this TEM. Attachment of US, MSC, and TV rate CCD cameras enables the digital recording of images. A holder allows the cryotransfer of specimen for low temperature observation.
| Instrument capabilities for function |
| point resolution 0.24 nm |
| line resolution 0.18 nm |
| Schottky type field emission source |
| super twin objective lens |
| bright field TEM/dark field TEM |
| bright field STEM/ dark field STEM |
| EDAX EDS |
| point elemental EDS analysis/line scan by EDS |
| elemental mapping by EDS |
| spectrum mapping |
| elemental analysis by EELS |
| elemental mapping by GIF |
| image analysis by DigitalMicrograph |
| 2kX2k US camera/MSC camera/TV camera |
| FEI single tilt specimen holder |
| FEI double tilt specimen holder |
| Gatan CT3500TR single tilt/rotate cryotransfer specimen holder |
| specimen cooling down to liquid nitrogen temperature |
| low voltage operation |