Publications on Semiconductor Characterization:

Photocurrent Reversal and Time-of-Flight in Amorphous Silicon-Hydrogen Films
  R. Könenkamp, A. M. Hermann and A. Madan
  Phil. Mag. Lett. B 48, 33 (1983)

Measurement of Mobility-Lifetime Product in a-Si:H p-i-n Diodes
  R. Könenkamp, A. M. Hermann and A. Madan
  Appl. Phys. Lett. 46, 405 (1985)

Transient Conductivity Profiles of Electrochemical Interfaces: The a-Si:H / Aqueous
  Electrolyte Contact
  R. Könenkamp and H. J. Lewerenz
 J. Electrochem. Soc. 132, 2297 (1985)

Detection of Deep-Lying Defects in a-SiH:C Alloy Films
  R. Könenkamp
  Phys. Rev. B 36, 2938 (1987)

Determination of Electric Field Profiles in Amorphous Silicon Solar Cells
  R. Könenkamp, S. Muramatsu, H. Itoh, S. Matsubara, and T. Shimada
  Appl. Phys. Lett. 57, 478 (1990)

Determination of transport parameters in C60 films
  G. Priebe, B. Pietzak, R. Könenkamp
  Appl. Phys. Lett. 71, 2160 (1997)

Internal Photoemission at the Si/metal  and Si/SiO2 interface
  K. Boedecker and R. Könenkamp
  J. Appl. Phys. 81, 6482 (1997)